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mbedtls/tests/include/test
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Paul Elliott 3d2db89d5c Access the test data mutex via accessor 
Remove the use of extern and instead use an accessor to get the address
of the test info mutex (defined only if MBEDTLS_TEST_MUTEX_USAGE is
defined, to hopefully stop more general usage)

Signed-off-by: Paul Elliott <paul.elliott@arm.com>
2024-01-19 20:44:32 +00:00
..
drivers test_driver_key_management: rename counter for export_public_key() hits 2023-12-04 11:04:42 +01:00
arguments.h update headers 2023-11-02 19:47:20 +00:00
asn1_helpers.h update headers 2023-11-02 19:47:20 +00:00
bignum_helpers.h Move bignum flag for negative zero into test_info 2024-01-09 18:01:58 +00:00
certs.h update headers 2023-11-02 19:47:20 +00:00
constant_flow.h update headers 2023-11-02 19:47:20 +00:00
fake_external_rng_for_test.h update headers 2023-11-02 19:47:20 +00:00
helpers.h Access the test data mutex via accessor 2024-01-19 20:44:32 +00:00
macros.h update headers 2023-11-02 19:47:20 +00:00
psa_crypto_helpers.h test_suite_psa_crypto_slot_management: modify check on open key slots 2023-12-04 11:04:42 +01:00
psa_exercise_key.h psa_exercise_key: add missing #else for KNOWN_SUPPORTED_BLOCK_CIPHER 2023-11-15 09:18:14 +01:00
psa_helpers.h update headers 2023-11-02 19:47:20 +00:00
random.h update headers 2023-11-02 19:47:20 +00:00
ssl_helpers.h ssl: use MBEDTLS_SSL_HAVE_* in tests 2023-11-08 14:09:16 +08:00